Inspection tools for highest quality control in chip production
The quality standards of the semiconductor industry require a high precision and 100 percent inspection in a fast running process. Especially the backend processes in the WLCSP production are more and more subject to the zero defect policy. Mühlbauer offers a wide range of vision inspection features to deliver highest quality output.
Mühlbauer SIDEWALL Inspection
Mühlbauer is pleased to announce the launch of a worldwide unique visual inspection feature called SIDEWALL inspection. Thereby all four side walls of a chip are inspected leading to an unprecedented degree in daily net output. The new side wall inspection is available for Mühlbauer’s die sorting systems DS 15000 and DS 20000 as well as DS Variation. Defects down to 10µm can be recognized. Field upgrades for existing DS 15000 systems can be quoted upon request as well.
NEW: Infrared Inspection
Infrared Light in Sidewall / Backside Inspection
Visible light: sees only surface
Infra Red light: sees the inner defects
(Die topside inspection)
(Die backside inspection)
After Sealing Inspection